TECH SUPPORT
Thickness Measurement
1. Angstrom-range optical path-length measurement with a high-speed scanning heterodyne optical interferometer
2. Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry
3. Epitaxial layer thickness measurement by far infrared ellipsometry
4. Excitation nonlinearities in emission reabsorption laser-induced fluorescence techniques
5. Fluid film thickness measurement with moiré fringes
6. Gratings for metrology and process control.2: thin film thickness measurement
7. High-accuracy characterization of titanium films for LiNbO
3
guided wave devices by optical densitometry
8. Investigation of a half-wave method for birefringence or thickness measurements of a thick, semitransparent, uniaxial, anisotropic substrate by use of spectroscopic ellipsometry
9. Issues involved with the use of optical reflectance systems for measurements of simox silicon-on-insulator thickness
10. Measurement of CVD thin films thickness by sample weighing method
11. Measurement of liquid-film thickness by laser interferometry
12. Oil film thickness measurement using airborne laser-induced water Raman backscatter
13. On the infrared thickness measurement of epitaxially grown silicon layers
14. Optical methods for thickness measurement on thin metal films
15. Photoresist thickness measurement using laser-induced fluorescence
16. Radiative transfer. I. Atmospheric transmission monitoring with modeling and ground-based multispectral measurements
17. Spectroscopic thin film thickness measurement system for semiconductor industries
18. Thermal-wave detection and thin-film thickness measurements with laser beam deflection
19. Thickness measurement for volume holograms by analysis of first-order diffraction
20. Thickness measurement of ultrathin films on metal substrates using ATR
21. Thickness measurement using Young's interferometric experiment
Grating Technologies
Spectrograph
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Particle Measurement
Laser
Thickness Measurement
Pulse Compression
Holographic Data Storage
Finger Print
Atomic Force Microscope
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Thickness Measurement 